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Co-authors
- Hyungjun KimSchool of Electrical abd Electronic Engineering, Yonsei UniversityVerified email at yonsei.ac.kr
- Ju Sang Park차세대융합기술연구원Verified email at snu.ac.kr
- Whang Je WooYonsei UniversityVerified email at yonsei.ac.kr
- Zonghoon LeeUNIST, Dept of Materials S&E / Institute for Basic Science (IBS), Center for Multidimensional CarbonVerified email at unist.ac.kr
- Kyung Yong KoSamsung ElectronicsVerified email at yonsei.ac.kr
- Han-Bo-Ram (Boram) LeeProfessor at Incheon National UniversityVerified email at inu.ac.kr
- Taejin ChoiSamsung Advanced Institute of TechnologyVerified email at samsung.com
- Jae-Min MyoungYonsei UniversityVerified email at yonsei.ac.kr
- GYEONG HEE RYUSchool of Materials Science and Engineering, Gyeongsang National UniversityVerified email at gnu.ac.kr
- Hyunyong ChoiProfessor, Department of Physics and Astronomy, Seoul National University, KoreaVerified email at snu.ac.kr
- Hanearl JungPh. D. Electrical & Electronic Engineering, Yonsei UniversityVerified email at yonsei.ac.kr
- Il-Kwon OhAssistant Professor at Electrical and Computer Engineering, Ajou UniversityVerified email at ajou.ac.kr
- Sangwan SimHanyang University ERICAVerified email at hanyang.ac.kr
- Taeyoon LeeProfessor of Electrical and Electronic Engineering, Yonsei UniversityVerified email at yonsei.ac.kr
- Jong-Hyun AhnYonsei UniversityVerified email at yonsei.ac.kr
- Yong Ju ParkYonsei universityVerified email at yonsei.ac.kr
- Kim Hyun GuSemiconductor R&D Center, Wonik IPSVerified email at wonik.com
- Taewook NamAssistant professor at Semiconductor Systems Engineering, Sejong UniversityVerified email at sejong.ac.kr
- Woo-Hee KimAssistant Professor at Hanyang University