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Co-authors
- Alex Elías-ZúñigaTecnológico de Monterrey, MéxicoVerified email at tec.mx
- Vicente Rodríguez-GonzálezInstituto Potosino de Investigación Científica y Tecnológica (IPICYT)Verified email at ipicyt.edu.mx
- Alan Osiris Sustaita Narváez Ph.D.School of Engineering and Science, Tecnológico de MonterreyVerified email at tec.mx
- Jackeline Iturbe EkTecnológico de MonterreyVerified email at tec.mx
- Sergio ObregónUniversidad Autónoma de Nuevo León, MéxicoVerified email at uanl.edu.mx
- Imperio Anel Perales MartínezInstituto Tecnológico y de Estudios Superiores de MonterreyVerified email at tec.mx
- Luis Manuel Palacios-PinedaProfesor Investigador (Instituto Tecnológico de Pachuca)Verified email at itpachuca.edu.mx
- luis armando diaz-torresCentro de Investigaciones en Optica, A.C.Verified email at cio.mx
- Matias SotoAndrews UniversityVerified email at andrews.edu
- Maria Guadalupe Méndez MedranoLaboratory of Physics of Interfaces and Thin FilmsVerified email at polytechnique.edu
- Diana Hernandez UrestiUniversidad Autónoma de Nuevo León (FCFM)Verified email at uanl.edu.mx